Schottky barrier height of MnSb(0001)/GaAs(111)B contacts: Influence of interface structure

Citation
T. Manago et al., Schottky barrier height of MnSb(0001)/GaAs(111)B contacts: Influence of interface structure, J APPL PHYS, 88(4), 2000, pp. 2043-2047
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
4
Year of publication
2000
Pages
2043 - 2047
Database
ISI
SICI code
0021-8979(20000815)88:4<2043:SBHOMC>2.0.ZU;2-P
Abstract
The Schottky barrier height (SBH) of MnSb(0001)/n-GaAs(111)B diodes was inv estigated in terms of current-voltage characteristics for three different G aAs surfaces, GaAs (root 19x root 19), GaAs (2x2), and sulfur passivated Ga As. We observed that the SBH and the ideality factor changed significantly depending on the GaAs surface structure prepared before the MnSb growth. Th e sulfur passivated sample was superior to the others in that it has a lowe r ideality factor and higher barrier. The SBH fell off linearly with increa sing ideality factor n. The SBH of MnSb(0001)/n-GaAs(111)B was estimated to be 0.94 eV by extrapolating the linear relationship to n=1. (C) 2000 Ameri can Institute of Physics. [S0021-8979(00)02916-9].