Scanning tunneling microscope (STM) light emission spectroscopy of surfacenanostructures

Authors
Ushioda, S
Citation
S. Ushioda, Scanning tunneling microscope (STM) light emission spectroscopy of surfacenanostructures, J ELEC SPEC, 109(1-2), 2000, pp. 169-181
Citations number
33
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
109
Issue
1-2
Year of publication
2000
Pages
169 - 181
Database
ISI
SICI code
0368-2048(200008)109:1-2<169:STM(LE>2.0.ZU;2-I
Abstract
We present an overview of the experimental method and physical principles o f scanning tunneling microscope (STM) light emission spectroscopy (STM-LES) . By this new spectroscopic technique one can obtain the optical emission s pectra of specific and individual surface nanostructures that are imaged by the STM. This method has been used to investigate the electronic transitio ns in surface nanostructures such as the protrusions of porous Si, the quan tum wells of a semiconductor, and the rows and valleys of the reconstructed Au(110) surface. (C) 2000 Elsevier Science B.V. All rights reserved.