Tw. Wu et J. Frommer, Micro-indentation and scanning probe microscopy to assess multilayer magnetic film damage, J MAGN MAGN, 219(1), 2000, pp. 142-152
We have combined several techniques to evaluate the effect of mechanical de
formation on the topography and magnetics of an underlying thin magnetic fi
lm. Micro-indentation techniques are used to introduce tailored deformation
s to magnetic recording disks. Atomic force microscopy (AFM) and magnetic f
orce microscopy (MFM) then map out the topography of the indentations and t
he effect on the underlying magnetic film. Indentation morphology includes
pyramidal and conical indents, linear scratches, and reciprocating wear tra
cks. The extent of topographical damage assessed by AFM correlates with the
carefully controlled normal and tangential forces of the micro-indenter. S
ub-surface 'damage' is assessed by MFM, monitoring for loss of resolution i
n pre-written magnetic data tracks. Mechanical tests are conducted at very
low speeds and loading rates; hence, frictional heating or other thermo-mec
hanical factors that might cause ambiguities in data interpretation can be
safely ruled out. By using the combination of micro-mechanical testing, Ram
an spectroscopy, and AFM/MFM techniques, we have found that mechanically in
troduced bit contrast degradation is attributed to physical modification of
the magnetic coating and protective overlayer. The indentation and scratch
tests both confirm that static pressure alone is not sufficient to cause t
he observed magnetic degradation; other mechanical factors must be invoked,
including alteration of the geometry of the magnetic coating. Microwear is
capable of causing magnetic damage at much lower pressures than indentatio
ns or scratches. From wear track data, the degree of disk surface damage is
correlated with the degree of magnetic bit contrast degradation. From wear
track data on DC-erased samples it is concluded that mechanical deformatio
n can induce magnetic contrast via concerted reorientation of grain c-axis
and, hence, reorientation of magnetic moments. (C) 2000 Elsevier Science B.
V. All rights reserved.