Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering

A double flat-crystal analyzer for inelastic X-ray scattering is described. The general correlation between the energy and direction of the X-rays tra nsmitted by the analyzer allows one to collect data for a range of energy t ransfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X-ray optic can be an alternative to a conventional spherical-focusing backscatt ering analyzer in resonant inelastic X-ray scattering experiments or when f lexible energy resolution or high momentum resolution is required.