Enhancement of resolution of DNA on silylated mica using atomic force microscopy

Authors
Tang, J Li, JW Wang, C Bai, CL
Citation
J. Tang et al., Enhancement of resolution of DNA on silylated mica using atomic force microscopy, J VAC SCI B, 18(4), 2000, pp. 1858-1860
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
18
Issue
4
Year of publication
2000
Pages
1858 - 1860
Database
ISI
SICI code
1071-1023(200007/08)18:4<1858:EORODO>2.0.ZU;2-2
Abstract
It is demonstrated that the mica surface covered with a nanometer-thick, we ll connected silane film can appreciably improve the lateral resolution of DNA molecules in comparison with that on bare mica using atomic force micro scopy. A typical value width of 4 nm can be obtained. We propose that the n anometer dimensioned porous surface provides an approach to eliminate the h ydrated salt layer associated with the condensation of DNA strands, and lea ds to the enhancement of lateral resolution. (C) 2000 American Vacuum Socie ty. [S0733-211X(00)02904-8].