Bilayer, nanoimprint lithography

Citation
B. Faircloth et al., Bilayer, nanoimprint lithography, J VAC SCI B, 18(4), 2000, pp. 1866-1873
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
18
Issue
4
Year of publication
2000
Pages
1866 - 1873
Database
ISI
SICI code
1071-1023(200007/08)18:4<1866:BNL>2.0.ZU;2-V
Abstract
Nanoimprint lithography has been shown to be a viable means of patterning p olymer films in the sub-100 nm range. In this work, we demonstrate the use of a bilayer resist to facilitate the metal liftoff step in imprinter fabri cation. The bilayer resist technology exhibits more uniform patterns and fe wer missing features than similar metal nanoparticle arrays fabricated with single layer resist. The bilayer resist relies upon the differential solub ility between poly(methyl methacrylate) and poly(methyl methacrylate methac rylic acid copolymer). Evidence is presented that shows the technique has a resolution of better than 10 nm. (C) 2000 American Vacuum Society. [S0734- 211X(00)03103-8].