A. Barcz et al., SELF AND IMPURITY-ION BEAM MIXING IN MOLECULAR-BEAM EPITAXY-GROWN GA(AL)AS AND CD(MN)TE STRUCTURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 51-54
The redistribution of thin markers due to ion irradiation was studied
by secondary ion mass spectrometry (SIMS) in selected compound semicon
ductors. It was found that, for marker species with infinite solubilit
y in the matrix such as Al in GaAs, Ga in AlAs or Mn in CdTe, the resu
ltant mixing efficiencies are much greater than those previously deter
mined for Si and most metals. At low doses, the extent of mixing is su
ppressed for tracer species with limited solubility such as delta-Be i
n GaAs or delta-In in CdTe. The results strongly suggest the importanc
e of thermo-dynamic forces in the irradiation-induced atomic rearrange
ments.