In-plane optical anisotropy of quantum well structures: From fundamental considerations to interface characterization and optoelectronic engineering

Citation
S. Cortez et al., In-plane optical anisotropy of quantum well structures: From fundamental considerations to interface characterization and optoelectronic engineering, J VAC SCI B, 18(4), 2000, pp. 2232-2241
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
18
Issue
4
Year of publication
2000
Pages
2232 - 2241
Database
ISI
SICI code
1071-1023(200007/08)18:4<2232:IOAOQW>2.0.ZU;2-U
Abstract
The recently discovered in-plane optical anisotropy of (001)-grown quantum wells offers a new theoretical and experimental insight into the electronic properties of semiconductor interfaces. We first discuss the coupling of X and Y valence bands due to the breakdown of rotoinversion symmetry at a se miconductor heterointerface, with special attention to its dependence on ef fective parameters such as the valence band offset. The intracell localizat ion of Bloch functions is explained from simple theoretical arguments and e valuated numerically from a pseudopotential microscopic model. The role of envelope functions is then considered, and we discuss the specific case of no-common atom interfaces. Experimental results and applications to interfa ce characterization are presented, and the potential of the "quantum confin ed Pockels effect" for device applications is finally discussed. (C) 2000 A merican Vacuum Society. [S0734-211X(00)03804-X].