ION-BEAM MIXING - DOES IT DEPEND ON THE SUBSTRATE THICKNESS

Authors
KOPCEWICZ M JAGIELSKI J GRABIAS A STOBIECKI F SZYMANSKI B
Citation
M. Kopcewicz et al., ION-BEAM MIXING - DOES IT DEPEND ON THE SUBSTRATE THICKNESS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 141-144
Citations number
12
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
127
Year of publication
1997
Pages
141 - 144
Database
ISI
SICI code
0168-583X(1997)127:<141:IM-DID>2.0.ZU;2-L
Abstract
The Ar-ion-beam mixing of Fe/Zr bilayers is studied by conversion elec tron Mossbauer spectroscopy as a function of the thickness of the Zr s ubstrate for doses ranging from 1 x 10(14) to 1 x 10(17) at./cm(2), Th e results clearly show that the efficiency of mixing significantly inc reases with increasing thickness of the Zr substrate, The mixing leads to amorphization of the Fe/Zr system, The mixing of Fe/Zr bilayers is compared with the mixing of Fe/Zr multilayers with corresponding thic knesses of the elemental layers.