THERMAL ANNEALING OF AR ION-BOMBARDED LITHIUM TANTALATE (LITAO3) SINGLE-CRYSTAL

Citation
Z. Zhang et al., THERMAL ANNEALING OF AR ION-BOMBARDED LITHIUM TANTALATE (LITAO3) SINGLE-CRYSTAL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 515-519
Citations number
17
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
127
Year of publication
1997
Pages
515 - 519
Database
ISI
SICI code
0168-583X(1997)127:<515:TAOAIL>2.0.ZU;2-7
Abstract
The effect of the different annealing ambients on the regrowth of the Ar ion amorphized LiTaO3 single crystal was investigated. Samples were amorphized on c+ face by 218 keV Ar ions at room temperature with dos e of 6 x 10(15) ions/cm(2) and then annealed at 550 degrees C, which w as below the Curie temperature (605 degrees C). The annealing gases st udied were wet O-2, dry O-2, wet Ar, and dry Ar. Optical measurements showed that room temperature Ar ion bombardment created oxygen vacanci es in the amorphized layer, which could only be annealed out in an O-2 ambient. Thermal annealing at 550 degrees C for 30 min resulted in re growth of the amorphized layer, and it was observed that oxygen ambien t annealing provided better regrowth than Ar ambient. Infrared spectro scopy showed that the hydrogen signal was enhanced when samples were a nnealed in wet ambient, which indicated hydrogen had diffused into the LiTaO3. The Li-7(p,alpha)He-4 nuclear reaction was used to study the possibility of Li loss during the annealing process. Transmission Elec tron Microscopy (TEM) showed that the Ar ion amorphized layer regrew i nto multidomain phase after 550 degrees C annealing.