Graded index lens characterisation and the diffraction limits

Authors
Froehly, L Froehly, C Verrier, I Brun, G Veillas, C
Citation
L. Froehly et al., Graded index lens characterisation and the diffraction limits, OPT COMMUN, 182(4-6), 2000, pp. 289-304
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
182
Issue
4-6
Year of publication
2000
Pages
289 - 304
Database
ISI
SICI code
0030-4018(20000815)182:4-6<289:GILCAT>2.0.ZU;2-A
Abstract
The refractive index profile of an axially graded index lens is determined up to its diffraction limits. To perform these tasks two different wavefron t measurement methods are used (Foucault knife edge and caustic method) and compared to each other. We will then conclude on the ability of stigmatism defect correction with gradient index lenses. (C) 2000 Published by Elsevi er Science B.V.