Direct imaging of highly charged ions in an electron beam ion trap

We have directly observed the ion cloud distribution in an electron beam io n trap using visible and ultraviolet fluorescence from lines in the ground term of Ar13+, Xe31+ and Xe32+ ions. Using a gated intensified charge coupl ed device camera, we have the capability to measure both static and dynamic ion cloud distributions. The images provide information about the trapped highly charged ions which is difficult to obtain by other methods. To demon strate the usefulness of the technique, we took images of static ion clouds under different conditions and compared the distributions to a simple mode l. We also recorded time resolved images which show that we can monitor the relaxation of the ion cloud toward equilibrium when the trapping condition s are suddenly changed. The information provided by such measurements can b e used to improve models of ion cloud dynamics and, combined with modeling, these techniques can help improve measurements of atomic data using electr on beam ion traps. [S0034-6748(00)04208-8].