Heteroorganic betaines 2. X-ray diffraction study of betaines containing the P+-C-Si-S- fragment

Citation
Vn. Khrustalev et al., Heteroorganic betaines 2. X-ray diffraction study of betaines containing the P+-C-Si-S- fragment, RUSS CHEM B, 49(5), 2000, pp. 929-932
Citations number
12
Categorie Soggetti
Chemistry
Journal title
RUSSIAN CHEMICAL BULLETIN
ISSN journal
10665285 → ACNP
Volume
49
Issue
5
Year of publication
2000
Pages
929 - 932
Database
ISI
SICI code
1066-5285(200005)49:5<929:HB2XDS>2.0.ZU;2-C
Abstract
The structures of three silicon-containing organophosphorus betaines contai ning the P+-C-Si-S- fragment were established by X-ray diffraction study. D ue to the attractive electrostatic interaction between the anionic and cati onic centers, the main chain adopts a gauche conformation, whereas this cha in in the S-ethyl derivative of the phosphonic salt [Ph3P+-CMe2-SiMe2SEt]Br - adopts a trans conformation. The changes in the geometric parameters of b etaines depending on the substituents at the phosphorus, carbon, and silico n atoms were analyzed. The P-S bond can in principle be formed, resulting i n the closure of the four-membered ring provided that additional steric hin drances at the silicon atom occur.