Measurement of scintillator parameters using pulsed X-ray excitation

A setup for measurement of the major scintillator parameters, including dec ay time constants, light yield, and emission spectrum, has been developed. It consists of three main components: a small-size source of short X-ray pu lses, a cryostat, and a registration system. The ultimate parameters charac terizing the source are as follows: pulse duration, similar to 0.5 ns; repe tition rate, 100 kHz; X-ray tube voltage, 30 kV; and current amplitude, 0.5 A. The registration system allows the measurements to be carried out in th e 200-800 nm spectral range over the time intervals from 0.5 ns to 50 mu s with resolution not worse than 0.1 ns. (C) 2000 MAIK "Nauka/Interperiodica" .