Imaging of spheres and surface profiling by confocal microscopy

Citation
Jf. Aguilar et al., Imaging of spheres and surface profiling by confocal microscopy, APPL OPTICS, 39(25), 2000, pp. 4621-4628
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
25
Year of publication
2000
Pages
4621 - 4628
Database
ISI
SICI code
0003-6935(20000901)39:25<4621:IOSASP>2.0.ZU;2-3
Abstract
An investigation of the imaging of spheres can aid in understanding details of the surface profiling method of confocal microscopy. The use of semicir cular masks to eliminate artifacts in confocal profiling is investigated ex perimentally. A theoretical treatment of image formation for a spherical ob ject in reflection confocal microscopy is presented. For large spheres a si mple approximate theory is described and is shown to be equivalent to appli cation of the Kirchhoff theory for surface scattering; (C) 2000 Optical Soc iety of America OCIS codes: 180.0180, 180.1790, 170.6900, 120.6660.