Scattering of s-polarized electromagnetic plane waves from a film with a shallow random rough surface on a perfect conductor

Citation
R. Garcia-llamas et C. Marquez-beltran, Scattering of s-polarized electromagnetic plane waves from a film with a shallow random rough surface on a perfect conductor, APPL OPTICS, 39(25), 2000, pp. 4698-4705
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
25
Year of publication
2000
Pages
4698 - 4705
Database
ISI
SICI code
0003-6935(20000901)39:25<4698:SOSEPW>2.0.ZU;2-9
Abstract
Scattering of s-polarized electromagnetic planes waves hom a film, with a s hallow random rough one-dimensional surface, bounded by vacuum and a perfec t conductor is calculated. An integral equation that relates the amplitude of the scattered field to the incident wave is found by use of the Rayleigh hypothesis. The integral equation is solved numerically and by use of the perturbation theory, up to the fourth order in the surface profile function . In the angular dependence of the incoherent part of the differential refl ection coefficient, the backscattering peak and two additional satellite pe aks are observed, owing to two guided waves supported by the him. Analysis of the perturbation solution reveals that the background scattering exhibit s minima and maxima as functions of the thickness. By studying the behavior of the scattering as a function of the absorption index of the dim, it is shown that the amplitudes of the peaks are low when k similar to 10(-2) and high when k similar to 10(-4). (C) 2000 Optical Society of America OCIS co des: 030.0030, 290.0290, 310.0310, 290.1350, 290.5880, 310.2790.