D. O'Neill et al., Dielectric enhancement and Maxwell-Wagner effects in ferroelectric superlattice structures, APPL PHYS L, 77(10), 2000, pp. 1520-1522
In an attempt to reproduce the functional properties associated with relaxo
r electroceramics, pulsed laser deposition has been used to fabricate thin-
film capacitor structures in which the dielectric layer is composed of a su
perlattice of Ba0.8Sr0.2TiO3 and Ba0.2Sr0.8TiO3. The properties of the capa
citors were investigated as a function of superlattice periodicity. The die
lectric constant was significantly enhanced at stacking periodicities of a
few unit cells, consistent with relaxor behavior. However, enhancement in d
ielectric constant was generally associated with high dielectric loss. Anal
ysis of the imaginary permittivity as a function of frequency shows that fi
ne-scale superlattices conform to Maxwell-Wagner behavior. This suggests th
at the observed enhancement of the real part of the dielectric constant is
an artifact produced by carrier migration to interfaces within the dielectr
ic. A comparison of this data with that already published on dielectric sup
erlattices suggests that previous claims of an enhancement in dielectric co
nstant may also be attributed to the Maxwell-Wagner effect. (C) 2000 Americ
an Institute of Physics. [S0003-6951(00)01136-0].