LATERAL MAGNETORESISTANCES OF EPITAXIAL ZNSE AND CDMNTE THIN-FILMS MEASURED BY THE MICROWAVE CONTACTLESS METHOD

Authors
WANG ZX CHU YL LING Z JIN CX WANG J HOU XY WANG X
Citation
Zx. Wang et al., LATERAL MAGNETORESISTANCES OF EPITAXIAL ZNSE AND CDMNTE THIN-FILMS MEASURED BY THE MICROWAVE CONTACTLESS METHOD, Journal of applied physics, 82(1), 1997, pp. 477-479
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
82
Issue
1
Year of publication
1997
Pages
477 - 479
Database
ISI
SICI code
0021-8979(1997)82:1<477:LMOEZA>2.0.ZU;2-W
Abstract
A microwave contactless method is developed to measure the magnetoresi stances of ZnSe and CdMnTe epitaxial layers grown by molecular beam ep itaxy on semi-insulating GaAs substrates. The carrier concentrations a nd Hall mobilities are derived from the experimental data. (C) 1997 Am erican Institute of Physics.