Integration of an electrochemical quartz crystal microbalance into a scanning electrochemical microscope for mechanistic studies of surface patterning reactions
C. Hess et al., Integration of an electrochemical quartz crystal microbalance into a scanning electrochemical microscope for mechanistic studies of surface patterning reactions, ELECTR ACT, 45(22-23), 2000, pp. 3725-3736
The scanning electrochemical microscope (SECM) is used in combination with
an electrochemical quartz crystal microbalance (EQCM) to investigate princi
ple modes of tip-induced interactions. The focus is on the influence of aco
ustic waves and surface modifying processes on the resonant frequency. Cons
iderable importance is attached to high frequency resolution and its enduri
ng accuracy, especially with regard to mechanistic studies of microstructur
ing processes. A two-dimensional pattern of standing acoustic waves over th
e entire quartz crystal was monitored for the first time, revealing the ani
sotropic thickness-shear motion. In the vertical direction, we detected sta
nding pressure waves caused by reflection at the plane apex of the very sma
ll tip, which caused frequency changes below 1 Hz. The mass sensitivity dis
tribution of the 10 MHz quartz crystal was mapped two-dimensionally, and an
anisotropy due to the orientation of the electrode tabs was found, corrobo
rating published results. The measured mass sensitivity at the center provi
des a maximum mass resolution of 50 pg, which is sufficient to elucidate me
chanistic sequences involved in microstructuring processes. (C) 2000 Elsevi
er Science Ltd. All rights reserved.