A reliability testing environment for off-the-shelf memory subsystems

Authors
Hwang, SH Choi, GS
Citation
Sh. Hwang et Gs. Choi, A reliability testing environment for off-the-shelf memory subsystems, IEEE DES T, 17(3), 2000, pp. 116-124
Citations number
9
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
17
Issue
3
Year of publication
2000
Pages
116 - 124
Database
ISI
SICI code
0740-7475(200007/09)17:3<116:ARTEFO>2.0.ZU;2-T
Abstract
A cyclotron-based radiation test environment enables engineers to character ize the soft-error sensitivity of memory subsystems and assess its impact a t the system level. Device/circuit modeling and simulation assist the radia tion experiments in detecting device-level single-event upsets.