Effect of the tunneling rates on the conductance characteristics of single-electron transistors

Citation
A. Scholze et al., Effect of the tunneling rates on the conductance characteristics of single-electron transistors, IEICE TR EL, E83C(8), 2000, pp. 1242-1246
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E83C
Issue
8
Year of publication
2000
Pages
1242 - 1246
Database
ISI
SICI code
0916-8524(200008)E83C:8<1242:EOTTRO>2.0.ZU;2-H
Abstract
We present calculations of the linear-response conductance of a SiGe based single-electron transistor (SET). The conductance and the discrete charging of the quantum dot are calculated by free-energy minimization. The free-en ergy calculation takes the discrete level-spectrum as well as complex many- body interactions into account. The tunneling rates for tunneling through t he source and lead barrier are calculated using Bardeen's transfer Hamilton ian formalism [1]. The tunneling matrix elements are calculated for transit ions between the zero-dimensional states in the quantum dot and the lowest subband in the one-dimensional constriction. We compare the results for the conductance peaks with those from calculations with a constant tunneling r ate where the shape of the peaks is only due to energetic arguments.