Study of x-ray emission from a table top plasma focus and its application as an x-ray backlighter

A study of a 2 kJ, 200 kA, table top plasma focus device as an intense x-ra y source is reported. The x-ray yield from a number of gases, (deuterium, n itrogen, neon, argon, and xenon) is measured as a function of filling press ure and in neon as a function of anode length. In gases with Z < 18, the pl asma implodes to form a uniform cylindrical column, whereas for Z greater t han or equal to 18, the plasma consists of a number of hot spots. A maximum x-ray yield of 16.6 J and pulse length of 10-15 ns was obtained in neon. T he x-ray emission was established to be due to H- and He-like line radiatio n. The temperature estimated from spectroscopic observations was about 300- 400 eV at an electron density of (3-5)x10(20) cm(-3) in neon. At low pressu res in neon, hard x-ray radiation, presumably due to electron beams was dom inant. Mesh images of different wire materials were recorded at the optimum pressure in neon as a proof of principle for x-ray backlighting. (C) 2000 American Institute of Physics. [S0021-8979(00)02617-7].