Magnetic behavior of nanostructured Fe films measured by magnetic dichroism

Citation
Kw. Edmonds et al., Magnetic behavior of nanostructured Fe films measured by magnetic dichroism, J APPL PHYS, 88(6), 2000, pp. 3414-3417
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
6
Year of publication
2000
Pages
3414 - 3417
Database
ISI
SICI code
0021-8979(20000915)88:6<3414:MBONFF>2.0.ZU;2-J
Abstract
The magnetic properties of Fe nanostructured films have been studied using magnetic linear and circular dichroism in x-ray photoemission spectroscopy. The samples were prepared by the deposition of nanoscale Fe clusters, size 1-4 nm, onto thin Cu films. The linear dichroism, which is used to measure the in-plane magnetization, increases with increasing film thickness, with a sharp increase between 1 and 1.5 ML coverage. The circular dichroism, wh ich measures the out-of-plane magnetization, is zero within the experimenta l error at all thicknesses studied. Capping an Fe film with an ultrathin Pd layer results in a factor of 3 decrease of the linear dichroism response. (C) 2000 American Institute of Physics. [S0021-8979(00)04518-7].