The magnetic properties of Fe nanostructured films have been studied using
magnetic linear and circular dichroism in x-ray photoemission spectroscopy.
The samples were prepared by the deposition of nanoscale Fe clusters, size
1-4 nm, onto thin Cu films. The linear dichroism, which is used to measure
the in-plane magnetization, increases with increasing film thickness, with
a sharp increase between 1 and 1.5 ML coverage. The circular dichroism, wh
ich measures the out-of-plane magnetization, is zero within the experimenta
l error at all thicknesses studied. Capping an Fe film with an ultrathin Pd
layer results in a factor of 3 decrease of the linear dichroism response.
(C) 2000 American Institute of Physics. [S0021-8979(00)04518-7].