C. Chauvet et al., Molecular beam epitaxy of ZnxBe1-xSe: Influence of the substrate nature and epilayer properties, J ELEC MAT, 29(6), 2000, pp. 883-886
We have studied the heteroepitaxial growth of ZnxBe1-xSe onto Si, GaAs and
GaP substrates. By comparing the growth on these different substrates, we s
howed that lattice-matching is not a sufficient condition to achieve a good
epitaxy. Then we have investigated by low-temperature photoluminescence an
d reflectivity spectroscopies a series of ZnxBe1-xSe alloys with Be content
up to 70%. This allowed us to locate the direct-to-indirect band-gap cross
over at x = 0.46. We found a bowing parameter b = 0.97 eV for the direct b
and-gap in the whole composition range. Finally, Zn0.59Be0.41Se and Zn0.55B
e0.45Se alloys lattice-matched, respectively, to GaP and Si substrates are
direct band-gap semiconductors which exhibit band-gap at 3.72 eV and 3.85 e
V.