Photoluminescence of strain-induced coupled InGaAs/GaAs quantum-dot pairs

Citation
Hw. Ren et al., Photoluminescence of strain-induced coupled InGaAs/GaAs quantum-dot pairs, J ELEC MAT, 29(5), 2000, pp. 520-524
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
29
Issue
5
Year of publication
2000
Pages
520 - 524
Database
ISI
SICI code
0361-5235(200005)29:5<520:POSCIQ>2.0.ZU;2-7
Abstract
Coupled quantum dot-pairs were fabricated by growing InP self-assembled isl ands as stressors on InGaAs/GaAs double quantum wells. State filling in the photoluminescence spectra was used to resolve the quantum states in the co upled dots. The total strain field below the stressor decays exponentially with a penetration depth of about 25 nm, within which a dot pair can be fab ricated. Strong coupling is observed at a barrier width less than 4 nm sepa rating the dot-pair. By increasing the indium composition in the lower well in order to match its dot level with one in the upper dot with identical q uantum numbers, resonant coupling between the electron states with identica l quantum numbers in the two dots can be achieved. Decoupling of the hole s tates and exchange of the electron bonding states from dominating the upper dot to the lower one are clearly resolved from the state energies and thei r spacings.