The aim of this work to investigate the cw-laser crystallization of amorpho
us a-Si1-xCx alloys as a function of laser power and alloy composition. As
the microRaman analysis reveals, many cases occur: in a silicon rich alloy
(x approximate to 0.3) we can obtain two crystalline phases, i.e. polycryst
alline Si or polycrystalline C, depending on the laser energy density irrad
iated on the film. The presence of polycrystalline SiC is observed only in
quasi-stoichiometric alloy (x approximate to 0.48) in the cubic beta-SiC ph
ase. The experiment has been performed with a laser pattern-writing system
that permits simultaneous control of annealing energy and focused spot size
. PC control allows several patterns to be traced on the same film.