XPS and ellipsometric characterization of zinc-BTA complex

This paper describes the study of the reaction of zinc with solutions of be nzotriazole in alcohol medium. It was found using XPS and Ellipsometry that this reaction creates an overlayer of about 0.5 nanometer of Zn++(BTA(2)(- )) on the zinc surface. Good agreement was found on the overlayer thickness between the ellipsometry results and the XPS peak intensities calculated w ith the model of Seah. The greater stability of Zn++(BTA-)(2) with respect to metallic zinc (+1.7 eV) and ZnO (+ 0.83 eV) provides good protection of the zinc against oxidation, reducing the corrosion current by about 40%. Th is results makes possible the application of the treatment of zinc with ben zotriazole not only in electronics, but also in other industrial applicatio ns such electromechanic engineering and building construction.