We identify, quantify, and correlate the polarization dipole across the wel
l of device-typical piezoelectric GaInN/GaN heterostructures with the lumin
escence properties of the well. This quantity reflects in the asymmetry of
the barrier height on either side of the well. By a detailed comparison of
photoreflection, electroreflection, low and high excitation density photolu
minescence we find that a very similar splitting occurs in the emission cha
racteristics of the well. We therefore conclude that the electronic band st
ructure within the wells is also to a very large extent controlled by the q
uantity of the polarization dipole in such polarization heterostructures.