Nitride-based laser diodes using thick n-AlGaN layers

Citation
T. Takeuchi et al., Nitride-based laser diodes using thick n-AlGaN layers, J ELEC MAT, 29(3), 2000, pp. 302-305
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
29
Issue
3
Year of publication
2000
Pages
302 - 305
Database
ISI
SICI code
0361-5235(200003)29:3<302:NLDUTN>2.0.ZU;2-S
Abstract
We obtained 1 mu m crack-free AlGaN layers up to an AlN molar fraction of 0 .4 by growing directly on low-temperature-deposited buffer layers. The buff er layer is effective for growing AlGaN layers without the stress caused by the lattice mismatch, We also demonstrated nitride-based laser diodes with such a 1 mu m crack-free n-AlGaN cladding layer/n-AlGaN contact layer/low- temperature-deposited buffer layer/sapphire structure, which showed a clear single spot in a far field pattern. The AlGaN-based structure can suppress optical leakage from the waveguide region to the underlying layer. The thr eshold current of the laser diode is about 230 mA, which is comparable to o r better than that of our laser diodes with the conventional GaN-based stru cture.