We obtained 1 mu m crack-free AlGaN layers up to an AlN molar fraction of 0
.4 by growing directly on low-temperature-deposited buffer layers. The buff
er layer is effective for growing AlGaN layers without the stress caused by
the lattice mismatch, We also demonstrated nitride-based laser diodes with
such a 1 mu m crack-free n-AlGaN cladding layer/n-AlGaN contact layer/low-
temperature-deposited buffer layer/sapphire structure, which showed a clear
single spot in a far field pattern. The AlGaN-based structure can suppress
optical leakage from the waveguide region to the underlying layer. The thr
eshold current of the laser diode is about 230 mA, which is comparable to o
r better than that of our laser diodes with the conventional GaN-based stru
cture.