Surface recombination and sulfide passivation of GaN

Citation
Gl. Martinez et al., Surface recombination and sulfide passivation of GaN, J ELEC MAT, 29(3), 2000, pp. 325-331
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
29
Issue
3
Year of publication
2000
Pages
325 - 331
Database
ISI
SICI code
0361-5235(200003)29:3<325:SRASPO>2.0.ZU;2-6
Abstract
The surface recombination velocity in n-type heteroepitaxial GaN(0001) is s hown to decrease dramatically when the surface is chemically treated with a queous and alcoholic solutions of inorganic sulfides, such as ammonium or s odium sulfide ((NH4)(2)S-x and Na2S). The room-temperature excitonic photol uminescence (PL) intensity increases by a factor of four to six after treat ment, and improvements persist for at least seven months in room air. Vario us other chemicals commonly used in device processing are investigated and shown to change the PL intensity by factors ranging from 0.7 to 2.5, buffer ed oxide etching being the most beneficial. Schottky barrier diodes using g old as the contact metal are fabricated using a sulfide treatment prior to evaporation. The barrier height from capacitance-voltage measurements is as high as 1.63 +/- 0.07 V, the highest value ever achieved on n-GaN. This re sult is evidence that the effect of surface states on the Fermi level has b een substantially reduced by the treatment.