Sl. Erlandsen et al., Field emission scanning electron microscopy (FESEM) entering the 21st century: Nanometer resolution and molecular topography of cell structure, J HISTOTECH, 23(3), 2000, pp. 249-259
The field of scanning electron microscopy (SEM) has undergone a revolution
in terms of resolution obtainable on biological samples in the last 4 decad
es. In the late 1960s, the introduction of electron guns using tungsten fil
aments for SEM provided resolution on the order of 10-20 nm and valuable in
formation on cell shape and morphology was obtained that had hitherto been
inaccessible. In the late 1980s, the development of stable cold field emiss
ion SEM (FESEM) with in-lens specimen positioning and above the lens collec
tion for secondary electron (Se) imaging provided a tremendous advance with
resolution in the nm range being possible. Accompanying these changes in r
esolution have been improved procedures in thin film technology with metal
film thickness being reduced from 10-20 nm to less than 1 nm for FESEM. Dev
elopments in cryoSEM have led to interpretable structure on biological samp
les of about 1-2 nm. Improvements in instrumentation, refinements in ultrat
hin film technology, and specimen preparation may lead to atomic level reso
lution exceeding 1 nm in the next decade.