Structural evolution, dielectric and electro-optic properties of sol-gel derived potassium titanyl phosphate thin films

Citation
Jp. Zhang et al., Structural evolution, dielectric and electro-optic properties of sol-gel derived potassium titanyl phosphate thin films, J MATER SCI, 35(19), 2000, pp. 4931-4935
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
35
Issue
19
Year of publication
2000
Pages
4931 - 4935
Database
ISI
SICI code
0022-2461(200010)35:19<4931:SEDAEP>2.0.ZU;2-7
Abstract
Transparent potassium titanyl phosphate (KTiOPO4) thin films were prepared by a sol-gel coating technique. The structural evolution of the KTP thin fi lms was examined by means of DTA/TGA, FT-IR, XRD and SEM. The effect of UV irradiation on the crystallization behavior was investigated and it was fou nd that the UV irradiation decreases the crystallization temperature of the KTP thin films and dried gels. The dielectric and electro-optic properties were evaluated. The dielectric measurement results show that the KTP thin films have a low dielectric constant of similar to 12 in the temperature ra nge of 25-100 degrees C and frequency range of 1-1000 kHz. The electro-opti c results indicate that the KTP thin films exhibit a quadratic electro-opti c effect and may have potential applications for electro-optic devices. (C) 2000 Kluwer Academic Publishers.