N. Bernstein et al., Energetic, vibrational, and electronic properties of silicon using a nonorthogonal tight-binding model, PHYS REV B, 62(7), 2000, pp. 4477-4487
We present calculations of energetic, electronic, and vibrational propertie
s of silicon using a nonorthogonal tight-binding (TB) model derived to fit
accurately first-principles calculations. Although it was fit only to a few
high-symmetry bulk structures, the model can be successfully used to compu
te the energies and structures of a wide range of configurations. These inc
lude phonon frequencies at high-symmetry points, bulk point defects such as
vacancies and interstitials, and surface reconstructions. The TS parametri
zation reproduces experimental measurements and ab initio calculations well
, indicating that it describes faithfully the underlying physics of bonding
in silicon. We apply this model to the study of finite temperature vibrati
onal properties of crystalline silicon and the electronic structure of amor
phous systems that are too large to be practically simulated with ab initio
methods.