Absolute coverage of cesium on the Si(100)-2X1 surface

Authors
Sherman, WB Banerjee, R DiNardo, NJ Graham, WR
Citation
Wb. Sherman et al., Absolute coverage of cesium on the Si(100)-2X1 surface, PHYS REV B, 62(7), 2000, pp. 4545-4548
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
7
Year of publication
2000
Pages
4545 - 4548
Database
ISI
SICI code
0163-1829(20000815)62:7<4545:ACOCOT>2.0.ZU;2-E
Abstract
He+ Rutherford backscattering spectrometry has been applied to measure the absolute saturation coverage of Cs on the Si(100)-2 x 1 surface at room tem perature. The measured Ca saturation coverage is 0.54+/-0.02 monolayers (ML ) [1 ML is the density of surface atoms for bulk-terminated Si(100), or 6.7 8 x 10(14)atoms/cm(2)]. This result supports structural models requiring a Cs coverage of 0.5 ML and refutes several alternative models.