Hot-electron effects in two-dimensional hopping with a large localization length

Citation
Me. Gershenson et al., Hot-electron effects in two-dimensional hopping with a large localization length, PHYS REV L, 85(8), 2000, pp. 1718-1721
Citations number
37
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
85
Issue
8
Year of publication
2000
Pages
1718 - 1721
Database
ISI
SICI code
0031-9007(20000821)85:8<1718:HEITHW>2.0.ZU;2-R
Abstract
We have studied nonlinear effects in the resistance of a two-dimensional sy stem with a large localization length on both sides of the crossover from w eak to strong localization. It is shown that nonlinearity in the hopping re gime is due to electron overheating rather than the field effects. This qua litatively new behavior is a signature of a two-dimensional hopping transpo rt with a large localization length.