Tn. Martynova et Mg. Voronkov, Plasmochemical deposition of chromium-doped silicon dioxide from heptamethylchlorocyclotetrasiloxane, RUS J AP CH, 73(5), 2000, pp. 851-853
Deposition of thin silicon dioxide films on silicon matrices by decompositi
on of heptamethylchlorocyclotetrasiloxane in a high-frequency discharge pla
sma was studied. The permittivity, density of the surface states, and incor
porated charge of the films were determined as influenced by the deposition
conditions. The dependence of the refractive index and the etching rate of
the films on the gas phase composition was also determined.