VAMAS TWA2 Project A2: evaluation of static charge stabilization and determination methods in XPS on non-conducting samples. Report on an inter-laboratory comparison
Wes. Unger et al., VAMAS TWA2 Project A2: evaluation of static charge stabilization and determination methods in XPS on non-conducting samples. Report on an inter-laboratory comparison, SURF INT AN, 29(8), 2000, pp. 535-543
First results of an inter-laboratory comparison (27 participants in Europe,
Japan and USA) of XPS data obtained with non-conducting samples are presen
ted. Binding energies of Al 2s for alumina, N 1s and imide C Is for Kapton
and Sr 3p(3/2) for a strontium titanate film on glass were obtained after s
tatic charge referencing with the help of 15 nm gold particles deposited at
the surface of the test samples. For the alumina sample C Is static charge
referenced data are also presented. Repeat standard deviations (s(r)), bet
ween standard deviations (s(b)), reproducibility standard deviations (s(R))
and total means are evaluated from the experimental data. It can be stated
that although the repeat standard deviation is as small as 0.05 eV in the
best case, the standard deviation characterizing the reproducibility of the
method is obviously not better than 0.15 eV in the best case at the presen
t time. The knowledge of these standard deviations is important for metrolo
gy, validations of analytical procedures relying on qualitative photoelectr
on spectroscopy and XPS databanking, Copyright (C) 2000 John Wiley & Sons,
Ltd.