Chromatic systems were originally developed for monitoring the optical emis
sions of plasma. This contribution describes how the technology has been ut
ilised on low- and high-pressure plasma systems. The speed of operation of
chromatic systems has allowed their use in the monitoring of fast changing
plasma, such as arcs and laser plumes. The chromatic methodology has now be
en extended from the optical domain and is used for more general signal pro
cessing. This more general application of the chromatic method is outlined
and is related to the plasma processing industry. (C) 2000 Elsevier Science
Ltd. All rights reserved.