The magnetic behavior of Mn-Zn ferrite thin films deposited on silicon and
sapphire substrates with and without a buffer layer of MgO was studied. The
films were grown in a vacuum chamber using a KrF* excimer laser. The magne
tic and structural properties of the films deposited were examined. The mag
netic behaviour of the film deposited on Si with a buffer layer of MgO was
studied comparatively to that deposited on other substrates, using Kerr eff
ect. The large coercive force obtained is related to the microstructure, wh
ich was investigated by AFM. The films were smooth and homogeneous. XRD-ana
lyses revealed the formation of Mn-Zn ferrite phase. (C) 2000 Elsevier Scie
nce Ltd. All rights reserved.