Optical properties of phase-change optical disks with SbxSe100-x films

Complex refractive indices of thermally evaporated SbxSe100-x thin films, b oth amorphous (as deposited) and crystallized after thermal treatment are d etermined in the spectral range 400-1000 nm. The results are used to simula te the optical characteristics (reflection, absorption and phase difference ) of multilayer stack configurations including two protective dielectric la yers, a reflective layer and SbxSe100-x thin films as a phase-change record ing layer. Optimal multilayer stack configurations as a function of the rec ording layer composition are determined. The applicability of SbxSe100-x th in films as recording materials for CD-RW and DVD-RW optical disks at lambd a = 640 and 780 nm is discussed. (C) 2000 Elsevier Science Ltd. All rights reserved.