Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces

Authors
Citation
Sq. Xiao et Jm. Howe, Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces, ACT MATER, 48(12), 2000, pp. 3253-3260
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
48
Issue
12
Year of publication
2000
Pages
3253 - 3260
Database
ISI
SICI code
1359-6454(20000717)48:12<3253:AOATIL>2.0.ZU;2-Q
Abstract
An explicit solution is obtained for a general two-dimensional deformation matrix between two phases containing any combination of expansion/contracti on and/or shear. Application of the solution to various cases of deformatio n shows that in the presence of a shear, an invariant line can be obtained even when the deformations along orthogonal directions are both contraction s or expansions. Utilization of the solution in the design of thin-film ove rgrowths on substrates and the relationship between the solution eigenvecto rs in real and reciprocal space are discussed. (C) 2000 Acta Metallurgica l ire. Published by Elsevier Science Ltd. All rights reserved.