Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors

Citation
Xz. Zheng et al., Cross talk and ghost talk in a microbeam free-space optical interconnect system with vertical-cavity surface-emitting lasers, microlenses, and metal-semiconductor-metal detectors, APPL OPTICS, 39(26), 2000, pp. 4834-4841
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
26
Year of publication
2000
Pages
4834 - 4841
Database
ISI
SICI code
0003-6935(20000910)39:26<4834:CTAGTI>2.0.ZU;2-5
Abstract
A diffraction-based beam-propagation model is used to study optical cross t alk in microbeam free-space optical interconnection (FSOI) systems. The sys tem consists of VCSEL's, microlenses, and metal-semiconductor-metal (MSM) d etectors, with the detectors modeled as amplitude gratings with low contras t ratio (based on experimental results). Different possible cross-talk sour ces are studied. Results show that, in an optimized system, the cross talk caused by diffractive scattering is not an issue. However, in such systems the principal reflection from a MSM detector surface creates two problems: VCSEL coupling and ghost talk. The coupling of the reflected beam into the VCSEL's may cause power oscillation (and increase the bit error rate), wher eas ghost talk will limit the distance-bandwidth product of the interconnec t system. This optical system is also abstracted in HSPICE together with th e laser driver and receiver circuits to analyze ghost talk in this system. Results show that at high speed (1 Gbit/s or more) these effects negatively affect system performance. (C) 2000 Optical Society of America. OCIS codes : 200.4650, 250.7260.