CdTe epilayers for uses in optical waveguides

CdTe epilayers have been grown by vapor phase epitaxy (VPE) on glass, MgO, sapphire, LiNbO3 and mica substrates, Scanning electron microscopy (SEM) an d X-ray diffraction (XRD studies show the good structural quality of the ep ilayers, In these epilayers, a few optical modes were excited with a 1.33-m u m laser. The measured propagation losses were in the range between 5 dB/c m and less than 0.5 dB/cm. From dark-mode m-lines, the epilayer thickness w as found to be in the 1-3 mu m range, in good accord with that obtained by SEM measurements. The refractive index obtained from the fitting is also in good accord with that of bulk CdTe.