We present in situ x-ray scattering studies of surface morphology evolution
during metal-organic chemical vapor deposition of GaN. Dosing the GaN(0001
) surface with Si is shown to change the growth mode from step-flow to laye
r-by-layer over a wide temperature range. Annealing of highly doped layers
causes Si to segregate to the surface, which also induces layer-by-layer gr
owth. (C) 2000 American Institute of Physics. [S0003-6951(00)02637-1].