Size control of erbium-doped silicon nanocrystals

Citation
J. St John et al., Size control of erbium-doped silicon nanocrystals, APPL PHYS L, 77(11), 2000, pp. 1635-1637
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
11
Year of publication
2000
Pages
1635 - 1637
Database
ISI
SICI code
0003-6951(20000911)77:11<1635:SCOESN>2.0.ZU;2-T
Abstract
This work describes the effects of pyrolysis oven length and erbium precurs or on the preparation of discrete erbium-doped silicon nanoparticles. These doped nanoparticles were prepared by the co-pyrolysis of disilane and the volatile complex Er(tmhd)(3) (tmhd=2,2,6,6-tetramethyl-3,5-heptanedionato). The particle sizes and size distributions were determined using high resol ution and conventional transmission electron microscopy. Erbium-doped silic on nanoparticles exhibit a selected area electron diffraction pattern consi stent with the diamond cubic phase and a distinctive dark contrast in the t ransmission electron microscope. The presence of erbium is confirmed by x-r ay energy dispersive spectroscopy. In general, the mean diameter of the ind ividual nanoparticles increases as the length of the pyrolysis oven used du ring their preparation is increased. (C) 2000 American Institute of Physics . [S0003-6951(00)02537-7].