G. Leibiger et al., Nitrogen dependence of the GaAsN interband critical points E-1 and E-1+Delta(1) determined by spectroscopic ellipsometry, APPL PHYS L, 77(11), 2000, pp. 1650-1652
The effects of the nitrogen concentrations on the E-1 and E-1+Delta(1) tran
sitions of tensile-strained GaAs1-yNy (0.1%less than or equal to y less tha
n or equal to 3.7%) grown pseudomorphically to GaAs by metalorganic vapor-p
hase epitaxy are studied by spectroscopic ellipsometry. Adachi's critical-p
oint composite model is employed for ellipsometry data analysis. Contrary t
o the well-known redshift of the band-gap energy E-0, we observe linearly b
lueshifted E-1 and E-1+Delta(1) transition energies with increasing nitroge
n composition y. For nitrogen compositions of 0 less than or equal to y les
s than or equal to 1.65%, the observed blueshift of the E-1 energy is well
explained by the sum of the effects of biaxial (001) strain and alloying. (
C) 2000 American Institute of Physics. [S0003-6951(00)02437-2].