Flux trapping in a superconducting thin film as revealed by simulations and scanning superconducting quantum interference device microscope observations
K. Tanaka et al., Flux trapping in a superconducting thin film as revealed by simulations and scanning superconducting quantum interference device microscope observations, APPL PHYS L, 77(11), 2000, pp. 1677-1679
Penetration of magnetic fluxes into a superconducting thin film that contai
ned holes was studied for fast and slow cooling rates (0.18 and 0.009 K/s,
respectively) under an ambient magnetic field of about 3 mu T. By using a s
canning superconducting quantum interference device microscope, we observed
trapped magnetic fluxes both inside and outside of holes prepared in a sup
erconducting film. The trapped fluxes outside the holes appeared in a regul
ar arrangement when the superconducting film was cooled at the slow rate. O
bserved arrangements of the trapped fluxes were compared with a simulation
that was based on a theoretical model that considered the surface barrier a
nd the interaction among fluxes. The simulation explained well the observed
arrangements of magnetic fluxes. (C) 2000 American Institute of Physics. [
S0003-6951(00)04537-X].