Recording of elevated temperature fatigue crack growth data by DCPD system

Citation
N. Ramachandran et al., Recording of elevated temperature fatigue crack growth data by DCPD system, HIGH TEMP M, 19(5), 2000, pp. 357-370
Citations number
16
Categorie Soggetti
Material Science & Engineering
Journal title
HIGH TEMPERATURE MATERIALS AND PROCESSES
ISSN journal
03346455 → ACNP
Volume
19
Issue
5
Year of publication
2000
Pages
357 - 370
Database
ISI
SICI code
0334-6455(200008)19:5<357:ROETFC>2.0.ZU;2-D
Abstract
The growth of "long" fatigue cracks, in alpha-beta titanium alloy forging, subjected to cyclic stresses, is studied in this paper. The fatigue crack g rowth rate (FCGR) data were recorded at room temperature, 350, 450, 550 and 650 degrees F using the Direct Current Potential Difference (DCPD) techniq ue. The DCPD method, used in this investigation, was found to record and co rrelate the potential difference in terms of crack growth rate (da/dN) and Mode I stress intensity factor range satisfactorily. Various factors relate d to error minimization and calibration equations for compact tension speci mens have been elaborated. Also discussed were the means to enhance the acc uracy of the data by the DCPD system for elevated temperature fatigue crack growth rate testing.