We present a novel, computerized method of examining cerebral cortical thic
kness. The normal cortex varies in thickness from 2 to 4 mm, reflecting the
morphology of neuronal sublayers. Cortical pathologies often manifest abno
rmal variations in thickness, with examples of Alzheimer's disease and cort
ical dysplasia as thin and thick cortex, respectively. Radiologically, imag
es are 2-D slices through a highly convoluted 3-D object. Depending on the
relative orientation of the slices with respect to the object, it is imposs
ible to deduce abnormal cortical thickness without additional information f
rom neighboring slices. We approach the problem by applying Laplace's Equat
ion (del(2)psi = 0) from mathematical physics. The volume of the cortex is
represented as the domain for the solution of the differential equation, wi
th separate boundary conditions at the gray-white junction and the gray-CSF
junction. Normalized gradients of psi form a vector field, representing ta
ngent vectors along field lines connecting both boundaries. We define the c
ortical thickness at any point in the cortex to be the pathlength along suc
h lines. Key advantages of this method are that it is fully three-dimension
al, and the thickness is uniquely defined for any point in the cortex. We p
resent graphical results that may cortical thickness everywhere in a normal
brain. Results show global variations in cortical thickness consistent wit
h known neuroanatomy. The application of this technique to visualization of
cortical thickness in brains with known pathology has broad clinical impli
cations. Hum. Brain Mapping 11:12-32, 2000. (C) 2000 Wiley-Liss, Inc.