ACOUSTIC MICROSCOPY TECHNIQUES FOR THE IN VESTIGATION OF SEMICONDUCTOR STRUCTURES

Authors
VALIEV KA REPIN VN
Citation
Ka. Valiev et Vn. Repin, ACOUSTIC MICROSCOPY TECHNIQUES FOR THE IN VESTIGATION OF SEMICONDUCTOR STRUCTURES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 58(7), 1994, pp. 129-133
Citations number
3
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa → ACNP
ISSN journal
03676765
Volume
58
Issue
7
Year of publication
1994
Pages
129 - 133
Database
ISI
SICI code
0367-6765(1994)58:7<129:AMTFTI>2.0.ZU;2-N